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923660-20
测试夹, IC, SOIC, 20 触点, 镀金触芯, 923系列
- 制造商:
- 3M 3M
- 制造商产品编号:
- 923660-20
- 库存编号
- 178282
- 也称为:
- GTIN UPC EAN: 00054007801016 80610336085
- 技术数据表:
- 923660-20 Datasheet
产品范围选择器 (923系列)
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技术文档 (1)
产品概述
The 923660-20 is a surface-mount Test Clip with headless head provides downsized series made of smaller components and higher densities. Now hard to access surface-mount ICs can be connected to test probes and logical assemblies quickly and easily without the risk of shorting out clips or damaging other board components. The surface-mount test clips are available in different pin sizes to accommodate a wide range of requirements. The industrial standard 0.25-inch square contact pins on 0.05-inch centres are staggered to permit easy attachment of IDC socket connectors or wire wrapping and help prevent shorting of adjacent probes. The clip allows safe, accurate and convenient testing of plastic leaded chip carrier (PLCC) and ceramic leadless chip carrier (LCC) style integrated circuits. The unique action wedge design of the test clip allows all four of its side to open simultaneously for one step, secure attachment to the PLCC being tested.
- Helical compression spring and insulating contact combs ensure contact integrity during testing
- Probe access points are immediately visible for fast and safe individual lead testing
- Staggered contact rows facilitate probe attachment & prevent accidental shorting of adjacent probes
- With positive attachment to device, test clip will not fall off when board is vertical
- Wiping action and high nominal force combine to provide excellent electrical contact
- Gold alloy plated leads
- High normal force
- Excellent electrical contact
- Long-term performance
应用
测试与测量, 工业
也称为
GTIN UPC EAN: 00054007801016 80610336085
可延期交货
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