测试夹, IC, SOIC, 20 触点, 镀金触芯, 923
CAD Models - Notice
CAD Models and drawings are provided to you on a revocable limited licence for your internal use only but remain the property of the manufacturer who retain all intellectual property rights and ownership. They are provided to assist you in decision making and as design guide but are not guaranteed to be error free, accurate or up to date and is not intended to be taken as advice.
Use of these CAD models and other options provided are downloaded and used entirely at your own risk and by continuing you confirm acceptance of the above.
- Helical compression spring and insulating contact combs ensure contact integrity during testing
- Probe access points are immediately visible for fast and safe individual lead testing
- Staggered contact rows facilitate probe attachment & prevent accidental shorting of adjacent probes
- With positive attachment to device, test clip will not fall off when board is vertical
- Wiping action and high nominal force combine to provide excellent electrical contact
- Gold alloy plated leads
- High normal force
- Excellent electrical contact
- Long-term performance
|1+||CNY288.31 (CNY325.79)||( )|