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923665-28

测试夹, IC, SOIC, 28 触点, 镀金触芯, 923系列

3M 923665-28

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制造商:
3M 3M
制造商产品编号:
923665-28
库存编号
1654361
技术数据表:
923665-28   Datasheet
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产品范围选择器 (923系列)

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产品信息

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:
SOIC

:
28触点

:
-

:
镀金触芯

:
923系列

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技术文档 (1)

产品概述

The 923665-28 is a surface-mount Test Clip with headless head. This series provides downsized series made of smaller components and higher densities. Now hard to access surface-mount ICs can be connected to test probes and logical assemblies quickly and easily without the risk of shorting out clips or damaging other board components. The 3M clips allow safe, accurate and convenient testing of plastic leaded chip carrier (PLCC) and ceramic leadless chip carrier (LCC) style integrated circuits. The unique action wedge design of the test clip allows all four of its side to open simultaneously for one step, secure attachment to the PLCC being tested.
  • Helical compression spring and insulating contact combs ensure contact integrity during testing
  • Probe access points are immediately visible for fast and safe individual lead testing
  • Staggered contact rows facilitate probe attachment & prevent accidental shorting of adjacent probes
  • With positive attachment to device, test clip will not fall off when board is vertical
  • Wiping action and high nominal force combine to provide excellent electrical contact
  • Gold alloy plated leads
  • High normal force
  • Excellent electrical contact
  • Long-term performance

应用

测试与测量, 工业

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CNY260.40 ( CNY294.25  含增值税)

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