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100D
测试配件, 连接器, 50 ohm, Beehive EMC探头放大器, 100
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CAD Models and drawings are provided to you on a revocable limited licence for your internal use only but remain the property of the manufacturer who retain all intellectual property rights and ownership. They are provided to assist you in decision making and as design guide but are not guaranteed to be error free, accurate or up to date and is not intended to be taken as advice.
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产品概述
The 100D from Beehive Electronics is a 100 series EMC probe EMC probe. It is an electric field probe, unlike the 100A/B/C. This probe has best spatial resolution of all the probes. However, because it is an electric field probe, it does not offer the common mode rejection that the magnetic field probes have. It is designed for identifying and fixing EMC problems. The 100D stub probe with its narrow tip offers the highest spatial resolution. It is ideally suited to tasks such as tracking EMC sources down to the individual pins of an IC. Because of the planar construction of the probes, even the large loops are only 0.11" thick, allowing the probe to be inserted into narrow seams and gaps.
- Integrated electrostatic shield in the loop probe eliminates common mode pick-up
- Multiple loop sizes offer optimum sensitivity and spatial resolution at different frequencies
- Probe dimensions optimized for access to tight spaces
- Stub, 0.08inch tip diameter
- Stub probe and sensitive to electric fields
- Can be driven by a signal source to generate fields for electromagnetic susceptibility testing
- Probe can be used to measure the signals present on an operational PC board
- Length is 6.35inch (excluding connector) and probe tip thickness is 0.11"
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