EVAL1ED3321MC12NTOBO1

EVAL1ED3321MC12NTOBO1 is an evaluation board for EiceDRIVER™ F3 enhanced with short-circuit protection. The Eval-1ED3321MC12N evaluation board is designed to be used by design engineers to evaluate the 1ED3321MC12N EiceDRIVER™ isolated gate driver IC in a half-bridge configuration. The evaluation board can be used to evaluate other ICs from the EiceDRIVER™ 1ED332xMC12N family by swapping the two gate driver ICs. It is suitable for double-pulse testing and offers active Miller Clamp, soft-off, and separate source/sink outputs. Operating over a wide voltage range in unipolar or bipolar configurations, it ensures tight part-to-part propagation delay matching. The gate driver safety certification: UL 1577 recognized with VISO, test = 6840V (rms) for 1 s, VISO = 5700V (rms) for 60s and IEC 60747-17/VDE 0884-11 approval (pending) with VIORM = 1.767kV (peak, reinforced).

• 40V absolute maximum output supply voltage
• Up to +6A /-8.5A typical output current
• Separate source and sink output for optimized gate driving
• DESAT short-circuit protection, soft-off turn-off option
• Active Miller clamp function and active shutdown
• High common-mode transient immunity CMTI greater than 300kV/μs
• 85ns typical propagation delay
• Tight IC-to-IC propagation delay matching
• 3.3V and 5V input supply voltage
• DSO-16 wide body package with 8mm creepage